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Development of Whispering Gallery Mode Polymeric Micro-optical Electric Field Sensors

Development of Whispering Gallery Mode Polymeric Micro-optical Electric Field Sensors

Published on: January 29, 2013

A multi-layer electro-optic field probe.

Dong-Joon Lee¹, Jae-Yong Kwon, Han-Young Ryu

¹Division of Physical Metrology, Korea Research Institute of Standards and Science, 1 Doryong-dong, Yuseong-gu, Daejeon 305-340, Korea. dongjoonlee@kriss.re.kr

|December 18, 2010

Summary

We developed a new electro-optic field probe using stacked electro-optic wafers. This multi-layered design significantly enhances sensitivity for electric field measurements by 6 dB compared to single-layer probes.

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Area of Science:

Electrical Engineering
Optoelectronics
Sensor Technology

Background:

Electro-optic field probes are crucial for measuring electric fields.
Existing designs face limitations in sensitivity and performance.
Interferometric modulation is a key sensing principle.

Purpose of the Study:

To introduce a novel design for electro-optic field probes.
To enhance the sensitivity and performance of electro-optic measurements.
To develop a robust method for probe calibration.

Main Methods:

A novel design method for electro-optic field probes using multi-stratified layers of electro-optic wafers.
Utilizing a serial stack of cascaded layers to enhance interferometric electro-optic light modulation.
Characterizing absolute sensitivity using a micro-TEM cell for precise electric field calibration.

Main Results:

The multi-stratified layered design enhances interferometric electro-optic light modulation.
The probe performance benefits from utilizing interference fringe slopes and field-induced phase retardations.
A 6 dB enhancement in sensitivity per unit electro-optic wafer volume was achieved compared to single-layer probes.

Conclusions:

The novel multi-layered design offers superior performance for electro-optic field probes.
This method provides a significant sensitivity enhancement for electric field measurements.
The developed probe and calibration method are valuable for accurate electric field sensing applications.