Jove
Visualize
Contact Us

Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are  scattered by the electron clouds around the sample atoms. The  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Electron ptychography reveals correlated lattice vibrations at atomic resolution.

Nature communications·2026
Same author

Platform and Framework for Time-Resolved Nanoscale Thermal Transport Measurements in STEM.

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada·2026
Same author

Quasi-2D Morphologies of a Non-Fullerene Acceptor Y6 by Interfacial Assembly via Langmuir-Schaefer Technique.

Advanced materials (Deerfield Beach, Fla.)·2025
Same author

Nanoindentation for Tailored Single-Photon Emitters in hBN: Influence of Annealing on Defect Stability.

ACS nano·2025
Same author

Approaching one nanosecond temporal resolution with square-wave-based control signals for interference gating.

Ultramicroscopy·2025
Same author

From text to insight: large language models for chemical data extraction.

Chemical Society reviews·2024
Same journal

Predictive drift compensation of multi-frame STEM via live scan modification.

Ultramicroscopy·2026
Same journal

Deep PACBED: Multitask analysis of PACBED images using deep neural networks.

Ultramicroscopy·2026
Same journal

Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography.

Ultramicroscopy·2026
Same journal

Brightness optimization in a 200 keV DTEM source by geometry-driven aberration suppression.

Ultramicroscopy·2026
Same journal

Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM).

Ultramicroscopy·2026
Same journal

Contamination analysis of the residual gas composition in transmission electron microscopy.

Ultramicroscopy·2026
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 5, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Aberration-compensated large-angle rocking-beam electron diffraction.

Christoph T Koch1

  • 1Max Planck Institute for Metals Research, Heisenbergstr. 3, 70569 Stuttgart, Germany. koch@mf.mpg.de

Ultramicroscopy
|January 14, 2011
PubMed
Summary
This summary is machine-generated.

A new technique called large-angle rocking-beam electron diffraction (LARBED) offers improved symmetry and thickness measurements for materials, even thin ones. This method provides accurate structure factor measurements, overcoming limitations of convergent beam electron diffraction (CBED).

More Related Videos

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092
08:53

Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092

Published on: October 2, 2017

Related Experiment Videos

Last Updated: Jun 5, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092
08:53

Biochemical and Structural Characterization of the Carbohydrate Transport Substrate-binding-protein SP0092

Published on: October 2, 2017

Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Convergent beam electron diffraction (CBED) is limited for symmetry, structure factor, and thickness determination in large unit cell materials due to specimen thickness requirements.
  • Existing techniques struggle with accuracy and applicability to diverse material types, necessitating advanced methods.

Purpose of the Study:

  • Introduce and validate the large-angle rocking-beam electron diffraction (LARBED) technique.
  • Demonstrate LARBED's capability for symmetry determination, specimen thickness measurement, and accurate structure factor quantification.
  • Highlight LARBED's advantages over CBED, especially for thin and large unit cell materials.

Main Methods:

  • Developed and implemented the large-angle rocking-beam electron diffraction (LARBED) technique.
  • Utilized illumination tilt coils to achieve a large angular range (0-100 mrad) for electron beam incidence.
  • Employed self-calibrating acquisition software to compensate for aberration-induced probe shifts, maintaining probe stability.

Main Results:

  • LARBED successfully acquired experimental data comparable to CBED patterns but over a significantly larger angular range.
  • Demonstrated accurate symmetry determination and thickness measurements, even for thin samples.
  • Showcased the potential for highly accurate structure factor measurements using the LARBED technique.

Conclusions:

  • LARBED provides a powerful alternative to CBED, overcoming its limitations for analyzing complex materials.
  • The technique enables precise crystallographic information extraction from a wider range of sample types and thicknesses.
  • LARBED, coupled with advanced software, offers a robust platform for advanced electron diffraction analysis.