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Updated: Jun 5, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Suppression of intermixing in strain-relaxed epitaxial layers
T Leontiou1, J Tersoff, P C Kelires
1Department of Mechanical & Materials Science Engineering, Cyprus University of Technology, PO Box 50329, 3036 Limassol, Cyprus.
Abstract:
Misfit strain plays a crucial role in semiconductor heteroepitaxy, driving alloy intermixing or the introduction of dislocations. Here we predict a strong coupling between these two modes of strain relaxation, with unexpected consequences. Specifically, strain relaxation by dislocations can suppress intermixing between the heterolayer and the substrate. Monte Carlo simulations and continuum modeling show that the suppression, though not absolute, can be surprisingly large, even at high temperatures. The effect is strongest for a large misfit (e.g., InAs on GaAs) or for thin substrates (e.g., Ge on silicon on insulator).

