Semiconductors
Types of Semiconductors
Schottky Barrier Diode
Metal-Semiconductor Junctions
Biasing of Metal-Semiconductor Junctions
P-N junction
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Updated: Jun 5, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
Paul M Koenraad1, Michael E Flatté
1COBRA Inter-University Research Institute, Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands. p.m.koenraad@tue.nl
Researchers can now observe and manipulate single dopants in semiconductors, enabling new quantum information devices and the emerging field of solotronics (solitary dopant optoelectronics). This breakthrough unlocks precise control over material properties for advanced applications.
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