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Related Concept Videos

Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and reduce chemical noise during analyte detection. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Related Experiment Video

Updated: Jun 5, 2026

Conducting Multiple Imaging Modes with One Fluorescence Microscope
08:32

Conducting Multiple Imaging Modes with One Fluorescence Microscope

Published on: October 28, 2018

Integrated spectrometer design with application to multiphoton microscopy.

Eric V Chandler1, Charles G Durfee, Jeffrey A Squier

  • 1Department of Physics, Colorado School of Mines, Golden, CO 80401, USA. echandle@mymail.mines.edu

Optics Express
|January 26, 2011
PubMed
Summary
This summary is machine-generated.

We developed a novel spectrometer for multiphoton microscopy, enabling spectral analysis of single quantum dots. This system reveals how excitation polarization influences their fluorescence emission, advancing nanoscale optical studies.

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Conducting Multiple Imaging Modes with One Fluorescence Microscope
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Published on: December 22, 2015

Area of Science:

  • Spectroscopy
  • Microscopy
  • Materials Science

Background:

  • Multifocal multiphoton microscopy allows for versatile sample interrogation.
  • Integrated spectrometers enhance microscopic analysis by providing spectral information.
  • Single-emitter spectroscopy is crucial for understanding nanomaterial properties.

Purpose of the Study:

  • To present a prism-based spectrometer integrated into a multifocal, multiphoton microscope.
  • To demonstrate the coincident image planes of the microscope and spectrometer.
  • To investigate spectral shifts in CdSe nanodots based on excitation polarization.

Main Methods:

  • Integration of a prism-based spectrometer with a multifocal, multiphoton microscope.
  • Utilizing coincident image planes to eliminate the need for an entrance slit.
  • Employing an EM-CCD detector for high-gain spectral interrogation of single emitters.
  • Observing two-photon excitation fluorescence emission from single CdSe nanodots.

Main Results:

  • Successful integration of a prism spectrometer into a multifocal multiphoton microscope.
  • Demonstration of coincident image planes simplifying spectral analysis.
  • Observation of spectral shifts in single CdSe nanodots.
  • Correlation of spectral shifts with excitation polarization.

Conclusions:

  • The integrated spectrometer provides a powerful tool for spectral analysis in multifocal multiphoton microscopy.
  • The system enables detailed investigation of single-emitter spectral properties.
  • Excitation polarization significantly affects the fluorescence emission spectra of CdSe nanodots.