Characterization and quantification of biological micropatterns using Cluster-SIMS

Li-Jung Chen1, Sunny S Shah, Stanislav V Verkhoturov

  • 1Department of Chemistry, Texas A&M University, College Station, TX, USA.

Surface and Interface Analysis : SIA
|February 1, 2011
PubMed
Summary

This study introduces a new method using C(60) (+) Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) to chemically analyze micropatterned surfaces. This technique helps evaluate cross-contamination and quantify immobilized species in biosensor development and tissue engineering.

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