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Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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A Soft X-Ray/EUV Reflectometer Based on a Laser Produced Plasma Source.

E M Gullikson1, J H Underwood, P C Batson

  • 1Center for X-Ray Optics, Materials Sciences Division, Lawrence Berkeley Laboratory, Berkeley, California 94720.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed
Summary
This summary is machine-generated.

A new soft x-ray reflectometer uses a tunable laser-produced plasma source for precise measurements. This instrument enables accurate characterization of x-ray optical elements like mirrors and filters.

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Area of Science:

  • * Physics
  • * Materials Science
  • * Optics

Background:

  • * Accurate characterization of x-ray optical elements is crucial for advanced applications.
  • * Existing reflectometry methods may have limitations in tunability or precision.

Purpose of the Study:

  • * To describe a novel soft x-ray reflectometer.
  • * To detail its capabilities for precision absolute measurements of x-ray optical elements.

Main Methods:

  • * Utilizes a laser-produced plasma source generated by a Q-switched Nd:YAG laser.
  • * Employs a high-throughput spherical grating monochromator for continuous wavelength tuning (40 Å to 400 Å).
  • * Incorporates an I0 detector for shot-to-shot intensity normalization to mitigate source variations.

Main Results:

  • * Achieved a time-averaged monochromatized flux exceeding 10^9 photons/s within a 1% bandwidth at 100 eV.
  • * Demonstrated photon "shot noise" limited measurements.
  • * Obtained submillimeter spot sizes and analyzed higher-order contamination for measurement corrections.

Conclusions:

  • * The developed soft x-ray reflectometer offers a versatile platform for precise absolute measurements.
  • * It is suitable for characterizing the reflectance of gratings and multilayer mirrors, and the transmittance of thin film filters.
  • * The instrument advances the capability for evaluating x-ray optical components.