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X-ray Crystallography

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Related Experiment Video

Updated: Aug 23, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

6000 lines/mm blazed grating for a high-resolution x-ray spectrometer.

D L Voronov, S Park, E M Gullikson

|October 27, 2022

Summary

This summary is machine-generated.

High-groove-density gratings were fabricated for Resonant Inelastic X-ray Scattering (RIXS) spectrometers. These advanced gratings enhance performance for the Qerlin beamline at the Advanced Light Source (ALS).

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Last Updated: Aug 23, 2025

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Published on: April 23, 2021

Area of Science:

Optics and X-ray Instrumentation
Materials Science and Nanofabrication

Background:

Resonant Inelastic X-ray Scattering (RIXS) requires high-performance gratings for precise energy analysis.
The Advanced Light Source (ALS) Qerlin beamline necessitates advanced optical components for its new spectrometer.

Purpose of the Study:

To design and fabricate high groove density blazed gratings for a RIXS spectrometer.
To optimize gratings for specific diffraction orders for enhanced spectral resolution.
To report on the fabrication processes and characterization of these novel gratings.

Main Methods:

Utilized nanofabrication techniques: e-beam lithography, nanoimprint, plasma etch, and anisotropic wet etching.
Fabricated gratings with groove densities of 6000 lines/mm and 3000 lines/mm.
Characterized gratings at beamline 6.3.2 of the ALS.

Main Results:

Successfully fabricated high groove density blazed gratings.
Achieved gratings optimized for 1st and 2nd negative diffraction orders.
Demonstrated the feasibility of advanced nanofabrication for synchrotron optics.

Conclusions:

The developed nanofabrication process is effective for producing high-quality gratings for RIXS.
These gratings will significantly improve the capabilities of the Qerlin beamline spectrometer.
Further characterization confirms the suitability of these gratings for advanced X-ray applications.