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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
X-ray Diffraction of Biological Samples01:10

X-ray Diffraction of Biological Samples

X-ray diffraction or XRD is an analytical tool that utilizes X-rays to study ordered structures such as crystalline organic and inorganic samples, polycrystalline materials, proteins, carbohydrates, and drugs.
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays areĀ  scattered by the electron clouds around the sample atoms. TheĀ  X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal crystal...

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Related Experiment Video

Updated: Jun 4, 2026

On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature
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On-Chip Crystallization and Large-Scale Serial Diffraction at Room Temperature

Published on: March 11, 2022

Diffraction-limited large x-ray optics.

E Spiller1

  • 1IBM Research Division, T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598.

Journal of X-Ray Science and Technology
|February 11, 2011
PubMed
Summary
This summary is machine-generated.

Technologies for creating large normal-incidence multilayer x-ray mirrors with diffraction-limited resolution are now available. These advancements have significant applications in x-ray astronomy and x-ray lithography.

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Area of Science:

  • Optics and Materials Science
  • X-ray Optics
  • Nanotechnology

Background:

  • High-resolution x-ray optics are crucial for advanced scientific and technological applications.
  • Previous limitations in mirror fabrication hindered diffraction-limited performance at normal incidence.
  • The development of multilayer coatings has been a key area of research.

Purpose of the Study:

  • To demonstrate the availability of technologies for producing large normal-incidence multilayer x-ray mirrors.
  • To highlight the achievement of diffraction-limited resolution with these mirrors.
  • To discuss the potential applications of these advanced x-ray optics.

Main Methods:

  • Fabrication of large-area multilayer coatings using advanced deposition techniques.
  • Characterization of mirror performance, including surface roughness and reflectivity.
  • Resolution testing to confirm diffraction-limited performance.

Main Results:

  • Successful production of large normal-incidence multilayer x-ray mirrors.
  • Demonstration of diffraction-limited resolution capabilities.
  • Validation of the technologies required for manufacturing.

Conclusions:

  • The technologies for producing high-performance normal-incidence multilayer x-ray mirrors are now mature.
  • These mirrors are poised to enable significant advancements in fields such as x-ray astronomy and lithography.
  • Further development and application of these mirrors are anticipated.