Point defect characterization in HAADF-STEM images using multivariate statistical analysis

Michael C Sarahan1, Miaofang Chi, Daniel J Masiel

  • 1SuperSTEM Laboratory, STFC Daresbury, Keckwick Ln., Warrington, WA4 4AD, UK. msarahan@superstem.org

Ultramicroscopy
|February 22, 2011
PubMed

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