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$Interference and Diffraction$ 02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.

Interference: Path Lengths

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Atomic Absorption Spectroscopy: Interference

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Related Experiment Video

Updated: Jun 4, 2026

A Multimodal Wide-Field Fourier-Transform Raman Microscope

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Carrier fringes in the two-aperture common-path interferometer.

Cruz Meneses-Fabian¹, Gustavo Rodriguez-Zurita

¹Benemérita Universidad Autónoma de Puebla, Facultad de Ciencias Físico-Matemáticas, Puebla, Pue, Mexico. cmeneses@fcfm.buap.mx

|March 4, 2011

Summary

This study introduces a simpler method to add linear phase to interference patterns using a grating in a common-path interferometer. This technique avoids beam tilt and offers greater versatility for optical applications.

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Area of Science:

Optics and Photonics
Interferometry
Diffraction Optics

Background:

Common-path interferometers are crucial for stable interference measurements.
Introducing linear phase, or carrier fringes, is essential for many interferometric techniques.
Existing methods for phase introduction can be complex or limited in versatility.

Purpose of the Study:

To present a novel and simplified method for introducing linear phase into interference patterns.
To demonstrate the effectiveness of placing a grating outside the Fourier plane in a 4f system.
To offer a more versatile alternative to existing phase-introduction techniques.

Main Methods:

Utilizing a two-aperture common-path interferometer constructed with a 4f optical imaging system.
Placing a diffraction grating at a specific location outside the Fourier plane.
Analyzing near-field diffraction to mathematically justify the introduction of carrier fringes.

Main Results:

Successfully introduced a linear phase into the interference pattern.
Demonstrated that no beam tilt is required for this phase introduction.
The method proved to be simpler, easier to implement, and more versatile than prior approaches.
Experimental fringe patterns validated the theoretical analysis.

Conclusions:

The proposed method provides an effective and straightforward way to introduce linear phase in interferometry.
This technique enhances the versatility of common-path interferometers for various optical applications.
The grating placement outside the Fourier plane offers a significant advantage in simplicity and applicability.