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    Area of Science:

    • Optics and Photonics
    • Metrology
    • Materials Science

    Background:

    • Electronic Speckle Pattern Interferometry (ESPI) is a common technique for measuring diffuse surface variations.
    • Traditional ESPI methods can suffer from contrast reduction and measurement errors due to spatial or temporal phase-shifting.
    • Accurate dynamic surface analysis requires robust interferometric techniques.

    Purpose of the Study:

    • To present a new out-of-plane ESPI system combined with a Michelson configuration.
    • To generate simultaneous, parallel, phase-shifted interferograms without fringe contrast reduction.
    • To enable more accurate tracking of the dynamic performance of surfaces.

    Main Methods:

    • An out-of-plane ESPI system was coupled to a Michelson interferometer.
    • Circular polarization states were employed to generate parallel phase-shifted interferograms.
    • The system's operating principle based on polarization modulation was described.

    Main Results:

    • Simultaneous parallel interferograms with different phase shifts were successfully generated.
    • The use of polarization states prevented fringe contrast reduction, mitigating common interferometric errors.
    • The temporal evolution of an aluminum plate was accurately monitored, demonstrating the system's capability.

    Conclusions:

    • The developed ESPI system offers a robust method for measuring diffuse surface variations.
    • Simultaneous phase-shifted interferograms generated via polarization modulation enhance measurement accuracy.
    • This technique is effective for tracking the dynamic performance of materials.