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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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Quantification of subsurface damage in a brittle insulating ceramic by three-dimensional focused ion beam tomography

N Payraudeau1, D McGrouther, K U O'Kelly

  • 1Department of Mechanical and Manufacturing Engineering, Trinity College Dublin, Dublin 2, Ireland. payraudn@tcd.ie

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|March 5, 2011
PubMed

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