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Updated: Jun 3, 2026
11:59
High-speed Particle Image Velocimetry Near Surfaces
Published on: June 24, 2013
Information content of the near field: three-dimensional samples
David G Fischer1, Richard A Frazin, Marius Asipauskas
1Research and Technology Directorate, NASA Glenn Research Center, Cleveland, Ohio 44135, USA. dgfischer@nasa.gov
Summary
This study analyzes the accuracy of 3D dielectric susceptibility reconstructions from noisy holographic microscopy data. We establish resolution limits, crucial for nanoscale material characterization.
Area of Science:
- Physics
- Materials Science
- Imaging Science
Background:
- Near-field holographic measurements are vital for nanoscale imaging.
- Reconstructing dielectric susceptibility from such data is challenging due to noise.
- The first Born approximation relates measurements to susceptibility.
Purpose of the Study:
- To analyze the accuracy and information content of 3D dielectric susceptibility reconstructions.
- To determine resolution limits in three dimensions for holographic microscopy.
- To evaluate reconstruction methods for noisy near-field data.
Main Methods:
- Utilized maximum-likelihood reconstruction based on singular value decomposition.
- Incorporated maximum a posteriori estimates with prior information.
- Derived semianalytical expressions for error analysis due to noise.
Main Results:
- Quantified the impact of noise on basis function coefficients in reconstructions.
- Established effective resolution limits in all three dimensions.
- Demonstrated results with numerical examples.
Conclusions:
- The study provides a framework for understanding the limits of 3D dielectric susceptibility imaging.
- Reconstruction accuracy is directly related to measurement noise and operator properties.
- The findings are applicable to scanning probe microscopy and similar techniques.
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