Analysis of EEL spectrum of low-loss region using the C(s)-corrected STEM-EELS method and multivariate analysis

Takashi Yamazaki1, Yasutoshi Kotaka, Yuji Kataoka

  • 1Device & Materials Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, Japan. yamazakit@jp.fujitsu.com

Ultramicroscopy
|March 15, 2011
PubMed