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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy

Jason P Killgore1, Roy H Geiss, Donna C Hurley

  • 1Materials Reliability Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA. jason.killgore@nist.gov

Small (Weinheim an Der Bergstrasse, Germany)
|March 16, 2011
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...