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Thickness measurement of organic films using Compton scattering of characteristic X-rays

Jong-Yun Kim1, Yong Suk Choi, Yong Joon Park

  • 1Nuclear Chemistry Research Division, Korea Atomic Energy Research Institute, Daedeok-daero, Dukjin-dong Yuseong-gu, Daejeon, Republic of Korea. kjy@kaeri.re.kr

Applied Radiation and Isotopes : Including Data, Instrumentation and Methods for Use in Agriculture, Industry and Medicine
|April 26, 2011
PubMed

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