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Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
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Pattern center determination in electron backscatter diffraction microscopy

Jay Basinger1, David Fullwood, Josh Kacher

  • 1Department of Mechanical Engineering, Brigham Young University, 435 Crabtree Building, Provo, UT 84602, USA. jay.basinger@gmail.com

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 24, 2011
PubMed
Summary

Accurate electron backscatter diffraction (EBSD) pattern center determination is crucial for high-resolution imaging. This study presents a novel method using a virtual spherical screen to refine pattern center (PC) alignment, improving EBSD data interpretation.

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