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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Pattern center determination in electron backscatter diffraction microscopyJay Basinger, David Fullwood, Josh Kacher, et al.
Ultramicroscopy|March 2, 2010
Reply to comment by Maurice et al. in response to "Bragg's Law Diffraction Simulations for Electron Backscatter Diffraction Analysis"Josh Kacher, Jay Basinger, Brent L Adams, et al.
Ultramicroscopy|June 13, 2009
Bragg's Law diffraction simulations for electron backscatter diffraction analysisJosh Kacher, Colin Landon, Brent L Adams, et al.
Scientific Reports|February 3, 2022
Influence of misorientation angle and local dislocation density on β-phase distribution in Al 5xxx alloysJahnavi Desai Choundraj, Josh Kacher
Ultramicroscopy|December 23, 2023
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detectionJosephine DeRonja, Matthew Nowell, Stuart Wright, et al.
Ultramicroscopy|October 11, 2025
Ultra-thin plan-view lamella made by focused ion beamMengkun Tian, Jingli Cheng, Nashrah Afroze, et al.
Nanoscale|March 21, 2020
In situ TEM measurement of activation volume in ultrafine grained goldSaurabh Gupta, Sandra Stangebye, Katherine Jungjohann, et al.
Ultramicroscopy|November 13, 2019
Investigating local oxidation processes in Fe thin films in a water vapor environment by in situ liquid cell TEMJordan W Key, Shixiang Zhu, Christopher M Rouleau, et al.
Nanoscale|May 12, 2021
Correction: In situ TEM measurement of activation volume in ultrafine grained goldSaurabh Gupta, Sandra Stangebye, Katherine Jungjohann, et al.
Nano Letters|April 14, 2023
Direct Observation of Grain-Boundary-Migration-Assisted Radiation Damage Healing in Ultrafine Grained Gold under Mechanical StressSandra Stangebye, Kunqing Ding, Yin Zhang, et al.
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