Updated: Jun 1, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Slawomir Prucnal1, Stefan Facsko, Christine Baumgart
1Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, P.O. Box 510119, 01314 Dresden, Germany. s.prucnal@hzdr.de
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