A fast algorithm for computing and correcting the CTF for tilted, thick specimens in TEM

Lenard M Voortman1, Sjoerd Stallinga, Remco H M Schoenmakers

  • 1Quantitative Imaging Group, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands. l.m.voortman@tudelft.nl

Ultramicroscopy
|July 12, 2011
PubMed

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