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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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X-ray Diffraction of Biological Samples

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Atomic Force Microscopy01:08

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Updated: May 31, 2026

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Spatially resolved diffractometry with atomic-column resolution.

Koji Kimoto1, Kazuo Ishizuka

  • 1National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan. kimoto.koji@nims.go.jp

Ultramicroscopy
|July 12, 2011
PubMed
Summary
This summary is machine-generated.

Spatially resolved diffractometry in scanning transmission electron microscopy (STEM) achieves 0.1 nm resolution. This technique reveals novel atomic-column contrast behaviors, enhancing STEM imaging analysis.

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

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Picometer-Precision Atomic Position Tracking through Electron Microscopy
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Picometer-Precision Atomic Position Tracking through Electron Microscopy

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Area of Science:

  • Materials Science
  • Physics
  • Analytical Chemistry

Background:

  • Scanning transmission electron microscopy (STEM) is a powerful tool for atomic-scale imaging.
  • Understanding diffraction patterns is crucial for interpreting STEM images.
  • Existing STEM techniques have limitations in detailed atomic-level analysis.

Purpose of the Study:

  • To demonstrate spatially resolved diffractometry for four-dimensional data acquisition in STEM.
  • To achieve high spatial resolution (approx. 0.1 nm) for detailed analysis.
  • To investigate the radial and azimuthal scattering angle dependences of atomic-column contrast.

Main Methods:

  • Utilized a stabilized STEM instrument with a spherical aberration corrector.
  • Acquired diffraction patterns at two-dimensional positions on a specimen.
  • Employed post-acquisition data processing techniques.
  • Observed atomic columns using excess Kikuchi band intensity in dark field images.

Main Results:

  • Achieved a spatial resolution of approximately 0.1 nm.
  • Observed clear atomic columns in dark field images even with small solid-angle detection.
  • Discovered novel radial and azimuthal scattering angle dependences of atomic-column contrast.
  • Found that atomic-column contrasts shift by tens of picometers with azimuthal angle changes, consistent with Rutherford scattering impact parameters.

Conclusions:

  • Spatially resolved diffractometry offers fundamental insights into STEM techniques like ADF and ABF imaging.
  • The technique provides a new analytical platform for advanced STEM imaging.
  • The findings contribute to a deeper understanding of electron scattering and image formation in STEM.