Updated: May 31, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Raouf Barboza1, Alessandro Alberucci, Gaetano Assanto
1Nonlinear Optics and OptoElectronics Lab (NooEL), Via della Vasca Navale 84, 00146 Rome, Italy.
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