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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Triaxial AFM probes for noncontact trapping and manipulation

Keith A Brown1, Robert M Westervelt

  • 1School of Engineering and Applied Sciences, and Department of Physics, Harvard University, Cambridge, Massachusetts 02138, United States.

Nano Letters
|July 20, 2011
PubMed

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