Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

S H Tessmer1, I Kuljanishvili

  • 1Department of Physics and Astronomy, Michigan State University, East Lansing, MI 48824, USA.

Nanotechnology
|August 12, 2011
PubMed
Summary

A new modeling method analyzes electron resonances using electrostatics and boundary elements. This approach accurately models experimental data from electric-field-sensitive scanning probe techniques.

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