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Updated: May 29, 2026

High-Temperature and High-Pressure In situ Magic Angle Spinning Nuclear Magnetic Resonance Spectroscopy
Published on: October 9, 2020
Nondestructive high-resolution solid-state NMR of rotating thin films at the magic-angle
Munehiro Inukai1, Yasuto Noda, Kazuyuki Takeda
1Department of Chemistry, Graduate School of Science, Kyoto University, Kitashirakawa Oiwake-cho, Sakyo-ku, Kyoto 606-8502, Japan. minukai@icems.kyoto-u.ac.jp
We developed a new nondestructive magic-angle spinning (MAS) nuclear magnetic resonance (NMR) method for thin films. This technique allows for detailed analysis of thin-film materials and devices, including in situ studies.
Area of Science:
- Materials Science
- Analytical Chemistry
- Solid-State Physics
Background:
- Nuclear Magnetic Resonance (NMR) is a powerful technique for atomic-level structural analysis.
- Traditional NMR methods can be destructive or unsuitable for analyzing thin-film materials.
- There is a need for nondestructive NMR techniques to study thin films in their native state.
Purpose of the Study:
- To introduce a novel nondestructive magic-angle spinning (MAS) NMR approach for thin films.
- To demonstrate the feasibility of this method for analyzing thin-film composition and structure.
- To enable in situ and ex situ studies of thin-film devices.
Main Methods:
- A new scheme for nondestructive MAS NMR was developed.
- Disk-shaped samples (7 mm and 12 mm) were stably spun at 14.2 and 7 kHz.
- NMR signals were detected using an additional coil integrated with a conventional MAS system.
- 7Li MAS NMR experiments were performed on a 200 nm LiCoO2 thin film.
Main Results:
- Stable spinning of thin-film samples was achieved at relevant speeds.
- The method successfully characterized a 200 nm LiCoO2 thin film.
- Ex situ experiments demonstrated the ability to trace conformational changes upon annealing.
- The nondestructive nature of the technique was validated.
Conclusions:
- The developed nondestructive MAS NMR approach is effective for thin-film analysis.
- This method facilitates ex situ studies, tracking material changes over time.
- The technique holds promise for in situ MAS NMR studies of thin-film devices.
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