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Updated: May 28, 2026

Implementation of a Reference Interferometer for Nanodetection
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Subpicometer length measurement using semiconductor laser tracking frequency gauge.

Rajesh Thapa1, James D Phillips, Emanuele Rocco

  • 1Smithsonian Astrophysical Observatory, Harvard Smithsonian Center for Astrophysics, Cambridge, Massachusetts 02138, USA.

Optics Letters
|October 4, 2011
PubMed
Summary
This summary is machine-generated.

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This study achieved unprecedented distance precision using inexpensive diode lasers in interferometers. The new method overcomes errors, enabling precise absolute distance measurements for applications like returning to a specific interferometer order.

Area of Science:

  • Optics and Photonics
  • Metrology
  • Laser Interferometry

Background:

  • Interferometry is crucial for precise distance measurements.
  • Spurious reflections and amplitude modulation are key error sources in interferometers.
  • Achieving high absolute distance precision is essential for applications requiring measurement continuity.

Purpose of the Study:

  • To demonstrate novel distance precision in resonant and nonresonant interferometers.
  • To control and mitigate errors caused by spurious reflections and amplitude modulation.
  • To enable reliable absolute distance measurements for resuming interferometer order after interruption.

Main Methods:

  • Utilized inexpensive telecommunications diode lasers.
  • Implemented a resonant interferometer configuration.

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Last Updated: May 28, 2026

Implementation of a Reference Interferometer for Nanodetection
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  • Developed techniques to control spurious reflections and amplitude modulation.

    • Main Results:

    • Achieved 0.14 pm (2 pm) incremental and 14 nm (2.9 μm) absolute distance precision at 1 s averaging time.
    • Demonstrated absolute distance precision well under λ/6 in the resonant interferometer.
    • Successfully controlled the primary error sources.

    Conclusions:

    • The demonstrated precision surpasses previous benchmarks.
    • The developed methods allow for robust absolute distance measurements.
    • This advancement facilitates applications requiring precise measurement resumption.