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Updated: May 28, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Mark G Reitsma1, Richard S Gates, Lawrence H Friedman
1Nanomechanical Properties Group, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
New "hammerhead" cantilevers enable precise surface force measurements using atomic force microscopy (AFM). These tools improve adhesion and friction measurements, enhancing accuracy and precision for various AFM applications.
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