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Updated: May 27, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Three-dimensional analysis by electron diffraction methods of nanocrystalline materials.

Christoph Gammer1, Clemens Mangler, Hans-Peter Karnthaler

  • 1University of Vienna, Physics of Nanostructured Materials, Boltzmanngasse 5, 1090 Vienna, Austria. christoph.gammer@univie.ac.at

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|November 5, 2011
PubMed
Summary

A new 3D electron diffraction method quantifies nanocrystalline structures. This technique determines the average size and shape of coherently scattering domains (CSD) in bulk materials, demonstrated on FeAl.

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Quantitative 3D analysis of nanocrystalline structures is challenging.
  • Existing methods often require complex sample preparation.
  • Understanding coherently scattering domains (CSD) is crucial for material properties.

Purpose of the Study:

  • To present a novel, straightforward 3D electron diffraction method for analyzing nanocrystalline structures.
  • To enable quantitative determination of average CSD size and morphology without serial sectioning.
  • To demonstrate the method's applicability to bulk nanocrystalline materials.

Main Methods:

  • Utilizing 3D electron diffraction for structural analysis.
  • Developing a method to determine CSD size and morphology directly from diffraction data.
  • Applying the technique to bulk nanocrystalline FeAl processed via severe plastic deformation.

Main Results:

  • The method allows straightforward 3D quantitative analysis of nanocrystalline structures.
  • Average CSD dimensions were determined for nanocrystalline FeAl.
  • Assuming ellipsoidal CSD, dimensions were found to be 19 ± 2 nm (width), 18 ± 1 nm (length), and 10 ± 1 nm (height).

Conclusions:

  • The presented 3D electron diffraction method offers a powerful tool for characterizing bulk nanocrystalline materials.
  • The technique simplifies the analysis of CSD size and morphology.
  • Accurate 3D structural data can be obtained efficiently, advancing materials characterization.