Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope

Sangjin Kwon1, Hyun Jeong, Mun Seok Jeong

  • 1School of Mechatronics, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea.

Summary

A new ultraviolet apertureless near-field scanning optical microscope (ANSOM) achieves 40 nm resolution for measuring photonic materials. This technique demonstrates high-resolution fluorescence measurement capabilities for advanced optical characterization.

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