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Updated: May 27, 2026

Assembly, Tuning and Use of an Apertureless Near Field Infrared Microscope for Protein Imaging
Published on: November 25, 2009
Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope
Sangjin Kwon1, Hyun Jeong, Mun Seok Jeong
1School of Mechatronics, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea.
A new ultraviolet apertureless near-field scanning optical microscope (ANSOM) achieves 40 nm resolution for measuring photonic materials. This technique demonstrates high-resolution fluorescence measurement capabilities for advanced optical characterization.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Accurate characterization of photonic materials requires high-resolution topographical and optical measurements.
- Existing techniques may lack the necessary resolution for sub-micron features.
Purpose of the Study:
- To develop a novel ultraviolet apertureless near-field scanning optical microscope (ANSOM).
- To demonstrate correlated topographical and optical measurements with high resolution.
- To validate the microscope's applicability for fluorescence measurements.
Main Methods:
- Development of a backscattering type ultraviolet apertureless near-field scanning optical microscope (ANSOM).
- Acquisition of near-field Rayleigh scattering images of GaN with periodic Cr dots.
- Measurement of tip-scattered photoluminescence from InGaN/GaN multi-quantum wells.
Main Results:
- Achieved an optical resolution of approximately 40 nm for topographical and optical characteristics.
- Demonstrated the capability for high-resolution fluorescence measurements using photoluminescence.
- Successfully correlated topographical and optical properties of photonic materials.
Conclusions:
- The developed ANSOM provides high optical resolution for photonic material characterization.
- The technique is suitable for detailed fluorescence analysis at the nanoscale.
- This advancement enables more precise investigation of nanostructured optical materials.
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