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Updated: May 27, 2026

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
Published on: April 28, 2023
Characterization of an organic field-effect thin-film transistor in operation using fluorescence-yield x-ray
Hiroyuki S Kato1, Hiroyuki Yamane, Nobuhiro Kosugi
1RIKEN (The Institute of Physical and Chemical Research), Wako, Saitama 351-0198, Japan.
Abstract:
In situ element-specific observation of electronic states of organic films beneath metal electrodes is achieved by x-ray absorption spectroscopy (XAS) in the bulk-sensitive fluorescence-yield (FY) mode. The molecular orientation in Au-covered oligo-thiophene films is confirmed by the C K-edge FY-XAS spectra and the applied bias dependence of the spectra is successfully detected for the first time. The present method can give deeper insights into the electronic-state investigation of various real-device systems under operational conditions.
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