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Circular mode: a new scanning probe microscopy method for investigating surface properties at constant and continuous
Hussein Nasrallah1, Pierre-Emmanuel Mazeran, Olivier Noël
1Molecular Landscapes and Biophotonic Skyline Group, Laboratoire de Physique de l'Etat Condensé, CNRS-UMR 6087, Université du Maine, Avenue Olivier Messiaen, 72085 Le Mans Cedex 9, France.
A new circular mode in scanning probe microscopy enables faster surface analysis by continuously moving the probe in a circular path. This method enhances measurements of physical properties, offering advantages in speed and simplicity.
Area of Science:
- Surface science
- Materials science
- Nanotechnology
Background:
- Conventional scanning probe microscopy (SPM) modes often involve linear back-and-forth probe movement.
- Limitations exist in measuring properties requiring high scanning velocities or continuous displacement.
Purpose of the Study:
- Introduce a novel SPM mode, the circular mode, for enhanced surface investigations.
- Enable measurements of physical properties under conditions of high scanning velocity and continuous displacement.
Main Methods:
- Implemented a circular horizontal displacement of the SPM probe relative to the sample plane.
- The probe follows a circular path, differing from conventional linear scanning.
Main Results:
- The circular mode achieves high and constant scanning velocities.
- It allows for simpler actuator calibration compared to linear modes.
- Demonstrated applications include investigating scanning velocity effects on adhesion, rapid friction coefficient measurement, and accelerated wear track generation for tribology.
Conclusions:
- The circular mode expands SPM capabilities for dynamic surface property measurements.
- Offers advantages in speed, simplicity, and applicability to tribological studies.
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