An improved equivalent simulation model for CMOS integrated Hall plates

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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

Yue Xu1, Hong-Bin Pan

  • 1School of Electronic Science & Engineering, Nanjing University, Nanjing, China. yuex@njupt.edu.cn

Sensors (Basel, Switzerland)
|December 14, 2011
PubMed

Keywords:
Verilog-Ahall platenon-linear effectssimulation model

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