Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Schottky Barrier Diode
P-N junction
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Updated: May 26, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
A Tiribocchi1, G Gonnella, D Marenduzzo
1Dipartimento di Fisica and Sezione INFN di Bari, Università di Bari, 70126 Bari, Italy.
Researchers found how to control liquid crystal blue phase defect patterns using electric fields. This enables the creation of new, fast-switching, energy-saving bistable devices for advanced applications.
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