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X-ray-Raman-scattering-based EXAFS beyond the dipole limit
Simo Huotari1, Tuomas Pylkkänen, J Aleksi Soininen
1Department of Physics, University of Helsinki, Helsinki, Finland. simo.huotari@helsinki.fi
Journal of Synchrotron Radiation
|December 22, 2011
Summary
X-ray Raman scattering extended X-ray absorption fine structure (XRS-EXAFS) accurately measures light elements. This bulk-sensitive method accounts for non-dipole contributions, improving accuracy for previously inaccessible systems.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Spectroscopy
Background:
- Extended X-ray Absorption Fine Structure (EXAFS) is crucial for material characterization.
- Soft X-ray absorption edges are vital for analyzing light elements but challenging to measure.
- X-ray Raman Scattering (XRS) offers a bulk-sensitive approach to EXAFS.
Purpose of the Study:
- To accurately measure and analyze XRS-EXAFS of polycrystalline diamond.
- To incorporate non-dipole contributions into XRS-EXAFS analysis.
- To extend the application of XRS-EXAFS to light-element systems.
Main Methods:
- Accurate measurement and data analysis procedures for XRS-EXAFS.
- Self-consistent real-space multiple-scattering calculations.
- Incorporation of angular-momentum components beyond the dipole approximation.
Main Results:
- XRS-EXAFS of polycrystalline diamond were accurately determined.
- Extracted XRS-EXAFS oscillations agreed well with theoretical calculations and prior soft X-ray EXAFS data.
- Deviations in multiple-scattering contributions were observed at higher momentum transfers due to non-dipole effects.
Conclusions:
- The study validates accurate XRS-EXAFS measurement and analysis techniques.
- Non-dipole contributions significantly impact XRS-EXAFS at higher momentum transfers.
- This work enables precise XRS-EXAFS analysis for light-element materials.
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