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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
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Prospects for electron microscopy characterisation of solar cells: opportunities and challenges

B G Mendis1, K Durose

  • 1Department of Physics, Durham University, South Road, Durham DH1 3LE, UK. b.g.mendis@durham.ac.uk

Ultramicroscopy
|January 3, 2012
PubMed

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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.