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Updated: May 24, 2026

In Vitro Multiparametric Cellular Analysis by Micro Organic Charge-modulated Field-effect Transistor Arrays
Published on: September 20, 2021
Fully automated measurement of the modulation transfer function of charge-coupled devices above the Nyquist frequency
Wouter Van den Broek1, Sandra Van Aert, Dirk Van Dyck
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. wouter.vandenbroek@ua.ac.be
Abstract:
The charge-coupled devices used in electron microscopy are coated with a scintillating crystal that gives rise to a severe modulation transfer function (MTF). Exact knowledge of the MTF is imperative for a good correspondence between image simulation and experiment. We present a practical method to measure the MTF above the Nyquist frequency from the beam blocker's shadow image. The image processing has been fully automated and the program is made public. The method is successfully tested on three cameras with various beam blocker shapes.
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