Related Experiment Video

Updated: May 24, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

40 keV atomic resolution TEM

David C Bell1, Christopher J Russo, Dmitry V Kolmykov

  • 1School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA. dcb@seas.harvard.edu

Ultramicroscopy
|February 24, 2012
PubMed

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