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Updated: May 24, 2026

A Guide to Structured Illumination TIRF Microscopy at High Speed with Multiple Colors
Published on: May 30, 2016
Muthuvel Arigovindan1, John W Sedat, David A Agard
1Keck Advanced Microscopy Center and the Dept. of Biochem. and Biophys., University of California at San Francisco, San Francisco, USA. mvel@msg.ucsf.edu
Depth-dependent spherical aberration in 3D structured illumination microscopy (SIM) primarily impacts signal detection, not illumination, which can be corrected computationally. Optical corrections, including using a deformable mirror, can address these aberrations.
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