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Updated: May 23, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Cheng Gong1, Mei Hui, Liquan Dong
1School of Optoelectronics, Beijing Institute of Technology, Beijing, China.
This study introduces an optical readout method using a narrow-strip filter to improve infrared imaging. The technique enhances image uniformity and reduces noise for bimaterial microcantilever focal plane arrays.
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