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A high resolution and large solid angle x-ray Raman spectroscopy end-station at the Stanford Synchrotron Radiation
D Sokaras1, D Nordlund, T-C Weng
1Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA. dsokaras@slac.stanford.edu
The Review of Scientific Instruments
|May 8, 2012
Summary
A new hard X-ray Raman spectroscopy end-station offers advanced capabilities for materials and energy science research. This innovative setup provides high-resolution data, enabling new scientific discoveries.
Area of Science:
- Photon science
- Materials science
- Spectroscopy
Background:
- X-ray Raman spectroscopy (XRS) is a powerful photon-in/photon-out technique.
- Advancements in instrumentation are crucial for expanding XRS applications.
Purpose of the Study:
- To introduce a newly developed X-ray Raman spectroscopy end-station at the Stanford Synchrotron Radiation Lightsource.
- To highlight its advanced features and capabilities for multidisciplinary research.
Main Methods:
- The end-station utilizes two multi-crystal Johann type spectrometers at forward (low-q) and backward (high-q) scattering angles.
- It incorporates Si(111) and Si(311) monochromators and Si(110) crystal analyzers for high-resolution measurements.
Main Results:
- The forward spectrometer achieves an energy resolution of 270 meV at 6462.20 eV with a 1.9% solid angle.
- The backward spectrometer enables the study of non-dipole transitions with 600 meV resolution and a 0.9% solid angle.
Conclusions:
- This new XRS end-station surpasses current instrumentation in performance.
- It opens new avenues for routine applications in energy sciences, material sciences, and physical chemistry.
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