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Determining on-axis crystal thickness with quantitative position-averaged incoherent bright-field signal in an

Huolin L Xin1, Ye Zhu, David A Muller

  • 1Department of Physics, Cornell University, Ithaca, NY 14853, USA. hx35@cornell.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 8, 2012
PubMed

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