Scanning Electron Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
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Updated: May 22, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Camille Probst1, Hendrix Demers, Raynald Gauvin
1McGill University, Mining and Materials Engineering, Montréal, Quebec H3A 2B2, Canada.
Smaller probe sizes do not improve backscattered electron (BSE) image resolution beyond the feature size. For larger probes, spatial resolution directly correlates with probe size, impacting imaging quality.
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