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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: May 22, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Spatial resolution optimization of backscattered electron images using Monte Carlo simulation.

Camille Probst1, Hendrix Demers, Raynald Gauvin

  • 1McGill University, Mining and Materials Engineering, Montréal, Quebec H3A 2B2, Canada.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 11, 2012
PubMed
Summary
This summary is machine-generated.

Smaller probe sizes do not improve backscattered electron (BSE) image resolution beyond the feature size. For larger probes, spatial resolution directly correlates with probe size, impacting imaging quality.

Related Experiment Videos

Last Updated: May 22, 2026

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
09:13

Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction

Published on: April 1, 2017

Area of Science:

  • Materials Science
  • Electron Microscopy
  • Image Analysis

Background:

  • Backscattered electron (BSE) imaging is crucial for materials characterization.
  • Understanding the factors influencing spatial resolution in BSE imaging is essential for accurate analysis.
  • Previous studies have explored various parameters, but a comprehensive analysis linking probe size to resolution is needed.

Purpose of the Study:

  • To investigate the relationship between probe size and spatial resolution in BSE images.
  • To analyze the influence of accelerating voltage, current intensity, sample geometry, and composition on spatial resolution.
  • To develop and validate an image synthesis method for simulating BSE images and determining their spatial resolution.

Main Methods:

  • Monte Carlo simulations were used to obtain backscattered electron coefficients.
  • An image synthesis method was developed based on these coefficients.
  • The Spatial resolution of simulated images was determined using the SMART-J method, which employs Fourier transform analysis.

Main Results:

  • Spatial resolution is limited by the probe size relative to the feature size.
  • Using a probe size smaller than the observed object does not enhance spatial resolution.
  • For probe sizes exceeding the feature size, spatial resolution is directly proportional to the probe size.
  • Improving signal-to-noise ratio enhances image resolution.

Conclusions:

  • Probe size is a critical parameter that dictates the achievable spatial resolution in BSE imaging.
  • Optimizing probe size in conjunction with signal-to-noise ratio is key to maximizing resolution.
  • The findings provide guidance for experimental parameter selection in electron microscopy for improved imaging.