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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
07:10

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

Note: gas phase structures of bare Si8 and Si11 clusters from molecular beam electric deflection experiments

D A Götz, S Heiles, R L Johnston

    The Journal of Chemical Physics
    |May 16, 2012
    PubMed
    Summary

    No abstract available in PubMed .

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