Updated: May 21, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Tsung-Yu Kao1, Qing Hu, John L Reno
1Department of Electrical Engineering and Computer Science & Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. wilt_kao@mit.edu
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