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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
Published on: April 1, 2017
Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron
1Australian Centre for Microscopy & Microanalysis, The University of Sydney, Madsen Building F09 Sydney, NSW 2006, Australia. patrick.trimby@sydney.edu.au
Ultramicroscopy
|July 17, 2012
Summary
Transmission Kikuchi diffraction (TKD) in scanning electron microscopy (SEM) now enables orientation mapping of nanostructured metals. This technique offers high spatial resolution for characterizing fine-grained materials.
Area of Science:
- Materials Science
- Nanotechnology
- Microscopy
Background:
- Characterizing nanostructured materials requires high spatial resolution.
- Conventional electron backscatter diffraction (EBSD) has limitations for nanoscale analysis.
Purpose of the Study:
- To apply transmission Kikuchi diffraction (TKD) in scanning electron microscopy (SEM) for orientation mapping of bulk nanostructured metals.
- To evaluate the effectiveness of SEM-TKD for analyzing materials with grain sizes in the 40-200 nm range.
Main Methods:
- Utilized scanning electron microscopy with transmission Kikuchi diffraction (SEM-TKD).
- Prepared thin, electron-transparent samples for analysis.
- Performed orientation mapping on dense (Ni) and light (Al-alloy) materials.
Main Results:
- SEM-TKD achieved orientation mapping of bulk nanostructured metals for the first time.
- The technique demonstrated a spatial resolution significantly below 10 nm.
- Reliable mapping of truly nanostructured metals and alloys was achieved, with mean grain sizes from 40-200 nm.
Conclusions:
- SEM-TKD is a powerful new technique for orientation mapping of nanostructured metals.
- Its high spatial resolution surpasses conventional EBSD for nanoscale characterization.
- SEM-TKD is expected to be invaluable for routine analysis of nanocrystalline and deformed microstructures.
