Analysis of time-resolved interaction force mode AFM imaging using active and passive probes

Area of Science:

• Materials Science
• Nanotechnology
• Surface Science

Background:

• Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
• Simultaneous topography and material property imaging presents challenges in accuracy.
• Active probe technology offers potential for enhanced AFM performance.

Purpose of the Study:

• To analyze time-resolved interaction force (TRIF) mode imaging for AFM.
• To develop and validate a nonlinear model for active AFM probes.
• To investigate the benefits of active tip control (ATC) for material property imaging.

Main Methods:

• Implementation of a nonlinear AFM probe model in Simulink®.
• Simulation of various imaging modes, probe structures, and tip-sample interactions.
• Verification of the model using passive AFM cantilevers and literature data.
• Application of the model to the force sensing integrated readout and active tip (FIRAT) probe.

Main Results:

• The active and damped nature of the FIRAT probe allows precise control over applied force.
• ATC minimizes sample indentation and topography errors during imaging.
• Constant contact time is maintained with ATC, ensuring stable contact and preserving material property data.
• Simulation results were validated through TRIF mode imaging of samples with heterogeneous properties.

Conclusions:

• The developed AFM model accurately simulates active probe behavior.
• Active tip control (ATC) significantly improves the accuracy of simultaneous topography and material property imaging.
• TRIF mode imaging with active AFM probes offers a powerful tool for nanoscale material characterization.