Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Back illuminated photo emission electron microscopy (BIPEEM).

Ultramicroscopy·2023
Same author

Low-Energy Electron Irradiation Damage in Few-Monolayer Pentacene Films.

The journal of physical chemistry. C, Nanomaterials and interfaces·2021
Same author

Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis.

Ultramicroscopy·2020
Same author

Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene.

Physical review letters·2019
Same author

Measuring chromatic aberration in LEEM/PEEM.

Ultramicroscopy·2019
Same author

Charge Catastrophe and Dielectric Breakdown During Exposure of Organic Thin Films to Low-Energy Electron Radiation.

Physical review letters·2018

Related Experiment Video

Updated: May 20, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

Selected-area diffraction and spectroscopy in LEEM and PEEM.

R M Tromp1

  • 1IBM Research Division, T.J. Watson Research Center, 1101 Kitchawan Road, P.O. Box 218, Yorktown Heights, NY 10598, USA. rtromp@us.ibm.com

Ultramicroscopy
|July 31, 2012
PubMed
Summary

This study examines how lens aberrations and magnetic prism dispersion impact electron spectroscopy and diffraction in advanced microscopes. Understanding these effects is crucial for accurate materials analysis using electron microscopy techniques.

More Related Videos

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Related Experiment Videos

Last Updated: May 20, 2026

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser
09:00

Experimental Methods for Spin- and Angle-Resolved Photoemission Spectroscopy Combined with Polarization-Variable Laser

Published on: June 28, 2018

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
10:12

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Area of Science:

  • Electron Microscopy
  • Surface Science
  • Materials Characterization

Background:

  • Advanced cathode lens microscopy instruments are essential for high-resolution surface analysis.
  • Selected Area Low Energy Electron Diffraction (SAED) and Angle Resolved Photo Electron Spectroscopy (ARPES) are key techniques for materials characterization.
  • Aberrations and dispersion can limit the precision of these analytical methods.

Purpose of the Study:

  • To investigate the impact of objective lens aberrations (spherical and chromatic) on SAED and ARPES.
  • To analyze the effect of chromatic dispersion in magnetic prism arrays on these techniques.
  • To assess the overall influence of these optical and magnetic effects on experimental outcomes in advanced electron microscopes.

Main Methods:

  • Theoretical analysis of optical aberrations in objective lenses.
  • Modeling of chromatic dispersion within magnetic prism arrays.
  • Simulation of experimental conditions for SAED and ARPES in cathode lens systems.

Main Results:

  • Quantified the degradation of spatial and energy resolution due to spherical and chromatic aberrations.
  • Determined the extent to which magnetic prism dispersion affects spectral peak positions and widths.
  • Established a correlation between specific aberration coefficients and the fidelity of diffraction patterns and photoelectron spectra.

Conclusions:

  • Spherical and chromatic aberrations significantly compromise the performance of SAED and ARPES.
  • Chromatic dispersion in magnetic prisms introduces notable errors in energy measurements.
  • Correction strategies for optical aberrations and careful design of magnetic prisms are vital for maximizing the capabilities of modern electron microscopy.