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Updated: May 19, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Alan Wei Min Lee1, Tsung-Yu Kao, David Burghoff
1Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA. awmlee@longwavephotonics.com
This study uses a frequency-agile terahertz quantum-cascade laser array to image dielectric sample interfaces. The system achieves 360 µm depth resolution, enabling non-destructive interface detection.
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