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Updated: May 18, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Glancing angle Talbot-Lau grating interferometers for phase contrast imaging at high x-ray energy
1Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218, USA.
Abstract:
A Talbot-Lau interferometer is demonstrated using micro-periodic gratings inclined at a glancing angle along the light propagation direction. Due to the increase in the effective thickness of the absorption gratings, the device enables differential phase contrast imaging at high x-ray energy, with improved fringe visibility (contrast). For instance, at 28° glancing angle, we obtain up to ∼35% overall interferometer contrast with a spectrum having ∼43 keV mean energy, suitable for medical applications. In addition, glancing angle interferometers could provide high contrast at energies above 100 keV, enabling industrial and security applications of phase contrast imaging.
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